| Zugriffsnummer | 15034 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Influence of calibration uncertainties on VNA S-parameter measurements |
| Autor(in); Institution |
Stumper, Ulrich; 2.2, Hochfrequenz und Magnetismus, PTB-Braunschweig
|
| Quelle/Jahr | Conference digest : 2002 Conference on Precision Electromagnetic Measurements:(2002), 132 - 133 |
| ISBN | 0-7803-7242-5 |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | 2002 Conference on Precision Electromagnetic Measurements ; CPEM 2002, Ottawa, 16-21, June 2002, Canada |
| Freie Schlagworte | vector network analyzers (VNA) ; sensitivity coefficients of S-parameters ; reflection coefficients |
| Zusammenfassung | For the widespread 12-term TMSO calibration of 4-sampler vector network analyzers (VNA), the sensitivity coefficients of the S-parameters of two-ports are derived with respect to the deviations of the reflection coefficients of the one-port calibration standards used. The obtained expressions are suitable for the establishment of the uncertainty budget. |
