Zugriffsnummer 14902
Dokumenttyp Zeitschriftenartikel
Sprache Englisch
Titel AC behaviour and loss phenomena in quantum Hall samples
Autor(in); Institution
Schurr, Jürgen; 2.11, Wechselstromgrößen, PTB-Braunschweig
Melcher, Jürgen; 2.11, Wechselstromgrößen, PTB-Braunschweig
Campenhausen, Aurel von; Infineon Technologies, München, GERMANY
Hein, Günter; 2.41, Halbleiterstrukturen, PTB-Braunschweig
Ahlers, Franz Josef; 2.41, Halbleiterstrukturen, PTB-Braunschweig
Pierz, Klaus; 2.41, Halbleiterstrukturen, PTB-Braunschweig
Quelle/Jahr Metrologia: 39 (2002), 1, 3 - 12
ISSN 0026-1394
Verlag Sèvres: BIPM
Freie Schlagworte quantum Hall samples ; edge-current ; quantum Hall resistance
Zusammenfassung The ac quantum Hall resistance of several GaAs-based samples has been investigated. The influence of temperature, current and frequency was measured for the plateau i = 2. Some measurements were performed for the plateau i = 4 in order to determine the scaling behaviour with respect to i. The plateau edge is shown to depend on the electronic temperature and the current at the plateau edge is distributed over the whole width of the sample. At the plateau centre, edge-current effects become apparent which depend on how close the filling factor is to an integer value. The losses of these edge currents cause the ac quantum Hall resistance to differ from the dc quantum Hall resistance.

Zitierung

Schurr, J., Melcher, J., Campenhausen, A. V., Hein, G., Ahlers, F. J., & Pierz, K. (2002). AC behaviour and loss phenomena in quantum Hall samples. Metrologia, 39(1), 3–12.

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