| Zugriffsnummer | 14724 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Counting electrons one by one - overview of a joint European research project |
| Autor(in); Institution |
Brom, H. E. van den; NMi Van Swinden Laboratorium, Delft, THE NETHERLANDS
Kerkhof, O.; NMi Van Swinden Laboratorium, Delft, THE NETHERLANDS
Lotkhov, Sergey V.; 2.42, Metallische Strukturen, PTB-Braunschweig
Bogoslovsky, Sergey A.; 2.42, Metallische Strukturen, PTB-Braunschweig
Willenberg, Gerd-Dietmar; 2.12, Gleichstromgrößen, PTB-Braunschweig
Scherer, Hansjörg; 2.42, Metallische Strukturen, PTB-Braunschweig
Zorin, Alexander B.; 2.42, Metallische Strukturen, PTB-Braunschweig
Pedersen, S.; Chalmers University of Technology, Department of Microelectronics and Nanoscience, Göteborg, SWEDEN
Kristoffersson, C.; Chalmers University of Technology, Department of Microelectronics and Nanoscience, Göteborg, SWEDEN
Delsing, P.; Chalmers University of Technology, Department of Microelectronics and Nanoscience, Göteborg, SWEDEN
Taslakov, M.; SP Swedish National Testing and Research Institute, Boras, SWEDEN
Ivanov, Z.; SP Swedish National Testing and Research Institute, Boras, SWEDEN
Nilsson, H.; SP Swedish National Testing and Research Institute, Boras, SWEDEN
Giblin, S.; National Physical Laboratory, Teddington, UK
Kleinschmidt, P.; National Physical Laboratory, Teddington, UK
Hof, C.; METAS, Swiss Federal Office of Metrology and Accreditation, Bern-Wabern, SWITZERLAND
Eichenberger, A. L.; METAS, Swiss Federal Office of Metrology and Accreditation, Bern-Wabern, SWITZERLAND
Overney, F.; METAS, Swiss Federal Office of Metrology and Accreditation, Bern-Wabern, SWITZERLAND
Jeanneret, B.; METAS, Swiss Federal Office of Metrology and Accreditation, Bern-Wabern, SWITZERLAND
Genèves, G.; BNM-LNE, Fontenay-aux-Roses, FRANCE
Feltin, N.; BNM-LNE, Fontenay-aux-Roses, FRANCE
Devoille, L.; BNM-LNE, Fontenay-aux-Roses, FRANCE
Gay, F.; BNM-LNE, Fontenay-aux-Roses, FRANCE
Piquemal, F.; BNM-LNE, Fontenay-aux-Roses, FRANCE
|
| Quelle/Jahr | Conference digest : 2002 Conference on Precision Electromagnetic Measurements:(2002), 322 - 323 |
| ISBN | 0-7803-7242-5 |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements ; CPEM 2002, Ottawa, 16-21, June, 2002, Canada |
| Freie Schlagworte | COUNT project ; SET ; Single-Electron Tunneling ; electrical current metrology ; single electron pump ; single electron counter ; quantum current standard ; Capacitance Standard |
| Zusammenfassung | The European COUNT project exploits two complementary single electron tunneling (SET) devices for use in electrical current metrology: a single electron pump as a current source and a single electron counter as a current meter. Apart from being a quantum current standard, the electron pump could be the basis of a capacitance standard. |
Zitierung
Brom, H. E. V. D., Kerkhof, O., Lotkhov, S. V., Bogoslovsky, S. A., Willenberg, G.-D., Scherer, H., Zorin, A. B., Pedersen, S., Kristoffersson, C., Delsing, P., Taslakov, M., Ivanov, Z., Nilsson, H., Giblin, S., Kleinschmidt, P., Hof, C., Eichenberger, A. L., Overney, F., Jeanneret, B., Genèves, G., Feltin, N., Devoille, L., Gay, F., & Piquemal, F. (2002). Counting electrons one by one - overview of a joint European research project. Conference on Precision Electromagnetic Measurements ; CPEM 2002, Ottawa, 16-21, June, 2002, Canada.