Zugriffsnummer 14682
Dokumenttyp Konferenzartikel in Zeitschrift
Sprache Englisch
Titel Properties of SNS Josephson junctions with HfTi interlayers
Autor(in); Institution
Hagedorn, Daniel; 2.402, RSFQ-Logikschaltungen, PTB-Braunschweig
Dolata, Ralf; 2.42, Metallische Strukturen, PTB-Braunschweig
Buchholz, Friedrich-Immanuel; 2.402, RSFQ-Logikschaltungen, PTB-Braunschweig
Niemeyer, Jürgen; 2.4, Quantenelektronik, PTB-Braunschweig
Quelle/Jahr EUCAS 2001 : proceedings of the 5th European Conference on Applied Superconductivity. Physica C: 372-376, pt. 1 (2002), 7 - 10
ISSN 0921-4534
Verlag Amsterdam: North-Holland, Elsevier
Konferenzangaben 5th European Conference on Applied Superconductivity ; EUCAS 2001, Copenhagen, 26-30, August, 2001, Denmark
Freie Schlagworte Josephson effect ; SNS technology ; superconducting electronics
Zusammenfassung The fabrication process in SNS technology has been improved to raise the characteristic voltage of superconductor-normal metal- superconductor (SNS) active elements. Josephson junctions with normal metal interlayers made from HfTi were realized in ramp-type design with dimensions down to the deep sub-micron range. To investigate the influence of the interfaces, junctions with different sequences of interim layers were fabricated, according to Nb/HfTi/Nb trilayer and Nb/HfTi-Nb-HfTi/Nb multilayer structures. Typical values of the characteristic voltage and the critical current density are Vc = 107 μV and jc = 550 kA/cm2 for Nb/HfTi/Nb junctions and Vc = 460 μV and jc = 210 kA/cm2 for Nb/HfTi-Nb-HfTi/Nb junctions, each for areas of A = 0.2 μm2. The junctions were experimentally investigated for the temperature dependence of critical currents, the influence of externally applied magnetic fields, and the application of microwave power. Work supported by the Deutsche Forschungsgemeinschaft (DFG), Germany (NI 253/3-1/3-2), the Bundesministerium für Bildung und Forschung (BMBF), Germany (13N6835, 13N7259, 13N7494) and the European Union (SMT4-CT98-2239).

Zitierung

Hagedorn, D., Dolata, R., Buchholz, F.-I., & Niemeyer, J. (2002). Properties of SNS Josephson junctions with HfTi interlayers. Physica C, 372-376, pt. 1, 7–10.

Exportieren

PTB-Publica Menü

Sprache wechseln: uk flag