| Zugriffsnummer | 13638 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | A reliable curvature sensor for measuring the topography of complex surfaces |
| Autor(in); Institution |
Schulz, Michael; 4.21, Bildoptik und Spektrometrie, PTB-Braunschweig
Weingärtner, Ingolf; 4.21, Bildoptik und Spektrometrie, PTB-Braunschweig
Thomsen-Schmidt, Peter; 4.21, Bildoptik und Spektrometrie, PTB-Braunschweig
|
| Quelle/Jahr | Optical devices and diagnostics in materials science:(2000), 84 - 93 |
| Schriftenreihe | Proceedings of SPIE: 4098 |
| Herausgeber(in) |
Andrews, David L.
|
| ISSN | 0277-786X |
| ISBN | 0-8194-3743-3 |
| Verlag | Bellingham, Wash.: SPIE |
| Konferenzangaben | International Symposium on Optical Science and Technology (SPIE Annual Meeting), San Diego, Calif., 01-04, August, 2000, USA |
| Zusammenfassung | The problem of measuring steep aspheres with high accuracy has not yet been generally solved. In this presentation, a particular sensor type is presented which can be used to measure the form of optically smooth surfaces with no restrictions as regards lateral extent or complexity. It is a curvature sensor which can be guided along the surface. Curvature is an intrinsic property of the artifact, which is independent of its position and angular orientation. |
