| Zugriffsnummer | 13559 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Self-pressure broadening of C2H2 between 0.1 kPa and 10 kPa [poster] |
| Autor(in); Institution |
Maaß, Dirk; 7.23, Vakuummetrologie, PTB-Berlin
Jousten, Karl; 7.23, Vakuummetrologie, PTB-Berlin
Seidel, Joachim; 7.2, Hochtemperaturphysik und Vakuum, PTB-Berlin
Kühne, Michael; 7.3, Temperatur und Wärme, PTB-Berlin
|
| Quelle/Jahr | Spectral line shapes: 15th ICSLS: 11 (2001), 351 - 353 |
| Schriftenreihe | AIP conference proceedings: 559 |
| Herausgeber(in) |
Seidel, Joachim; 7.2, Hochtemperaturphysik und Vakuum, PTB-Berlin
|
| ISSN | 0094-243X |
| ISBN | 1-56396-991-2 |
| DOI | |
| Verlag | Woodbury, NY: AIP |
| Konferenzangaben | 15th International Conference on Spectral Line Shapes, Berlin, 10-14, July, 2000, Germany |
| Klassifikationscode | PACS: 42.62.Fi ; PACS: 82.80.-d ; PACS: 42.55.-f |
| Zusammenfassung | With a view to possible application for partial pressure measurement, we measured the absorption profiles of the C2H2 R(7) overtone transition (2v1 + v2 + v3) at 847.5 nm by means of tunable-diode-laser absorption spectroscopy in combination with a Fabry-Perot resonator to increase the effective absorption length. Approximating the measured line shape by a Voigt profile, the self-pressure broading was determined in the pressure range from 0.1 kPa to 10 kPa. |
