| Zugriffsnummer | 13014 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Evaluation of lateral shearing interferograms |
| Autor(in); Institution |
Elster, Clemens; 8.31, Softwarequalitätssicherung und Messdatenverarbeitung, PTB-Berlin
|
| Quelle/Jahr | Advanced mathematical and computational tools in metrology IV:(2000), 76 - 87 |
| Schriftenreihe | Series on advances in mathematics for applied sciences: 53 |
| Herausgeber(in) |
Ciarlini, Patricia; IAC/CN, Roma, ITALY
Richter, Dieter; 8.3, Metrologische Informationstechnik, PTB-Berlin
|
| ISBN | 981-02-4216-6 |
| Verlag | Singapore [u.a.]: World Scientific |
| Konferenzangaben | 4th Workshop on Advanced Mathematical & Computational Tools in Metrology, Oxford, April, 1999, UK |
| Freie Schlagworte | First difference operator ; Generalized inverse ; lateral shearing interferometry |
| Zusammenfassung | Lateral shearing interferograms furnish as a result differences of the wavefront under study from which the wavefront is to be reconstructed. The properties of the first difference operator associated with lateral shearing interferograms are discussed. It is shown that the generalized inverse is bounded, and the generalized inverse is given in terms of a Fourier expansion for suitably chosen shearing parameters. Reconstruction procedures are proposed for analysing several shearing interferograms. It is shown that, in the discrete case, any wavefront can be reconstructed up to an arbitrary constant from only two interferograms in the 1-d case and from only four interferograms in the 2-d case provided that the shearing parameters and measurement points are suitably chosen. Furthermore, the reconstruction procedures are shown to be stable. Finally, numerical results are presented. |
