Zugriffsnummer 11986
Dokumenttyp Zeitschriftenartikel
Sprache Englisch
Titel Highly sensitive electrometers based on single Cooper pair tunneling
Autor(in); Institution
Zorin, Alexander B.; 2.401, Einzelelektronentunneln, PTB-Braunschweig
Lotkhov, Sergey V.; 2.401, Einzelelektronentunneln, PTB-Braunschweig
Pashkin, Yu. A.; NEC, Tsukuba, Ibaraki, JAPAN
Zangerle, Hermann; 2.401, Einzelelektronentunneln, PTB-Braunschweig
Krupenin, V. A.; Moscow State University, Moscow, RUSSIA
Weimann, Thomas; 2.401, Einzelelektronentunneln, PTB-Braunschweig
Scherer, Hansjörg; 2.401, Einzelelektronentunneln, PTB-Braunschweig
Niemeyer, Jürgen; 2.4, Quantenelektronik, PTB-Braunschweig
Quelle/Jahr Journal of Superconductivity: 12 (1999), 6, 747 - 755
ISSN 0896-1107
DOI
Verlag New York, NY: Kluwer
Freie Schlagworte Coulomb and Josephson effects ; thermal and quantum fluctuations ; ultrasmall tunnel junctions ; Coulomb blockade ; Bloch states
Zusammenfassung A superconducting transistor structure comprising two Josephson tunnel junctions connected in series and a small island in between, which is capacitively coupled to a gate, is considered. When self-capacitances of the junctions are sufficiently small that the corresponding charging energy Ec is of the order of magnitude of the Josephson coupling strength EJ (and both are ≥ kBT), the interplay of the charging and Josephson effects in the circuit becomes essential. This leads to a characteristic I-V curve which can be effectively modulated by the gate in two limit cases of external electrodynamic impedance Zs(ω): (a) Zs = Rs ≥ RQ ≈ 6.5 kΩ and (b) Rs ≤ RQ. Both circuits can serve as electrometers which are competitive with raditional single-electron devices. Preliminary experimental results are discussed.
Rechteinformation 1999, Plenum

Zitierung

Zorin, A. B., Lotkhov, S. V., Pashkin, Y. A., Zangerle, H., Krupenin, V. A., Weimann, T., Scherer, H., & Niemeyer, J. (1999). Highly sensitive electrometers based on single Cooper pair tunneling. Journal of Superconductivity, 12(6), 747–755. https://doi.org/10.1023/a:1007780925567

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