Zugriffsnummer 11705
Dokumenttyp Konferenzartikel
Peer Review unbekannt
Sprache Englisch
Titel Artefact based traceability concept for large co-ordinate measuring machines (CMMS)
Autor(in); Institution
Bartscher, Markus; 5.32, Koordinatenmessgeräte, PTB-Braunschweig
Busch, Konrad; 5.32, Koordinatenmessgeräte, PTB-Braunschweig
Schwenke, Heinrich; 5.32, Koordinatenmessgeräte, PTB-Braunschweig
Trapet, Eugen; Unimetrik S.A., Legutiano, Alava, SPAIN
Wäldele, Franz; 5.3, Koordinatenmesstechnik und Messgerätebau, PTB-Braunschweig
Quelle/Jahr Métrologie 99 : actes des conférences = Métrologie 99 : proceedings:(1999), 158 - 161
ISBN 2-909430-88-X
Verlag Nanterre: Mouvement Français pour la Qualité
Konferenzangaben Le 9ème Congrès International de Métrologie: Métrologie 99, Bordeaux, 18-21, Octobre, 1999, France
Freie Schlagworte Large CMMs ; Traceability ; Parametric Errors
Zusammenfassung Traceability of CMMs in industry is an important task. For small- and medium-sized CMMs the Physikalisch-Technische Bundesanstalt has developed artefact-based methods for full error analysis, which is a prerequisite for establishing traceability. For large CMMs (>3 m), only artefacts for interim and acceptance testing exist. Methods based on these artefacts and methods based on lasers can hardly provide full error mapping of the CMM economically in an industrial environment. The paper describes the development of artefacts and dedicated methods to perform full error assessment of large CMMs suitable for industrial application. The work is funded within the EC SM&T Programme.
Rechteinformation 1999, Mouvement Français pour la Qualité

Zitierung

Bartscher, M., Busch, K., Schwenke, H., Trapet, E., & Wäldele, F. (1999). Artefact based traceability concept for large co-ordinate measuring machines (CMMS). Le 9ème Congrès International de Métrologie: Métrologie 99, Bordeaux, 18-21, Octobre, 1999, France.

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