| Zugriffsnummer | 11683 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Methods and artifacts to calibrate large CMMs [poster] |
| Autor(in); Institution |
Arriba, L.; Trimek, SPAIN
Trapet, Eugen; Trimek, SPAIN
Bartscher, Markus; 5.32, Koordinatenmessgeräte, PTB-Braunschweig
Franke, Matthias; 5.32, Koordinatenmessgeräte, PTB-Braunschweig
Balsamo, A.; IMGC, Torino, ITALY
Costelli, G.; DEA Brown and Sharpe, ITALY
Torre, S.; DEA Brown and Sharpe, ITALY
Kitzsteiner, F.; Zeiss, GERMANY
San Martin, F.; GPE, SPAIN
|
| Quelle/Jahr | Precision engineering - nanotechnology : proceedings of the 1st International EUSPEN conference: 2 (1999), 391 - 394 |
| Schriftenreihe | Berichte aus der Fertigungstechnik |
| Herausgeber(in) |
McKeown, Pat
Kunzmann, Horst; Präsidium, MP, PTB-Braunschweig
|
| ISBN | 3-8265-6085-X |
| URL | |
| Verlag | Aachen: Shaker |
| Konferenzangaben | Precision Engineering - Nanotechnology: 1st International Conference and General Meeting of the European Society for Precision Engineering and Nanotechnology (euspen), Bremen, 31, May - 04, June, 1999, Germany |
| Freie Schlagworte | Large CMMs ; Traceability ; Parametric Errors |
| Zusammenfassung | Up to now methods using artifacts to inspect large coordinate measuring machines (CMMs) are suitable only for interim checks and verification. For a fullscale error analysis of larger CMMs (at least one axis > 2 m) no readily applicable methodology exists so far, thus VDI and ISO have recently started activities yielding traceability of large CMMs. Regarding this background methods for a fullscale error analysis of large CMMs (calibration, error correction and performance tests) were developed under the EC funded SM&T Programme (project SMT4-PL97-2330). Methods are based on calibrated artifacts, which are described here: Light weight ball plates, disassemblable ball plates and disassembable multiball bars. CMM manufacturers and users are testing methods and artifacts. Error models were extended to include non-rigid-body errors, typical for large CMMs (methods for error assessment and algorithms for numerical correction). |
| Rechteinformation | 1999, Shaker |
Zitierung
Arriba, L., Trapet, E., Bartscher, M., Franke, M., Balsamo, A., Costelli, G., Torre, S., Kitzsteiner, F., & San Martin, F. (1999). Methods and artifacts to calibrate large CMMs [poster]. Precision Engineering - Nanotechnology: 1st International Conference and General Meeting of the European Society for Precision Engineering and Nanotechnology (euspen), Bremen, 31, May - 04, June, 1999, Germany.