| Zugriffsnummer | 11441 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | 4d photoionization of free singly charged xenon ions |
| Autor(in); Institution |
Gottwald, Alexander; 7.12, Röntgenradiometrie, PTB-Berlin
Gerth, Ch.; 7.12, Röntgenradiometrie, PTB-Berlin
Richter, Mathias; 7.11, UV- und VUV-Radiometrie, PTB-Berlin
|
| Quelle/Jahr | Physical Review Letters: 82 (1999), 10, 2068 - 2070 |
| ISSN | 0031-9007 |
| DOI | |
| Verlag | Ridge, NY: American Physical Society |
| Klassifikationscode | PACS: 32.80.Hd ; PACS: 32.80.Fb |
| Zusammenfassung | Electron spectroscopy in direct 4d photoionization of free Xe+ ions has been realized for the first time, applying various timing and coincidence techniques to suppress and to monitor on line the strong fluctuating background. The ionization energies of 4d5/2 and 4d3/2 electrons of Xe+(5p52P3/2) and Xe+(5p52P1/2) were determined and compared to calculated RHF(CI) values and to corresponding results of neutral Xe(5p61S0) atoms to study the influence of the outer-shell electron occupation on the 4d-1 inner-shell process. |
| Rechteinformation | 1999, American Physical Society |