Zugriffsnummer 11252
Dokumenttyp Zeitschriftenartikel
Sprache Englisch
Titel Margins of junction parameter spread for non-hysteretic Josephson junction arrays
Autor(in); Institution
Kim, Kyu-Tae; Korea Research Institute of Standards and Science, Daejeon, KOREA
Behr, Ralf; 2.6, Elektrische Einheiten, PTB-Braunschweig
Müller, Franz; 2.4, Quantenelektronik, PTB-Braunschweig
Quelle/Jahr Superconductor Science and Technology: 16 (2003), 12, 1344 - 1348
ISSN 0953-2048
URL
Verlag Bristol: Institute of Physics Publishing Ltd
Zusammenfassung The programmable Josephson voltage standard shows robust step stability and is convenient for many metrological applications. The advantages of the programmable Josephson voltage standard are due to the array of non-hysteretic Josephson junctions with very high uniformity. We have numerically investigated the non-hysteretic Josephson junction arrays: externally shunted SIS (superconductor-insulator-superconductor) junctions and SINIS (superconductor-insulator-normal metal-insulator-superconductor) junction array. For the externally shunted SIS junction, we found the existence of an optimal range of the the shunt inductance. For the SINIS junction array, the maximum tolerable nonuniformity of the junction parameters and the microwave power could be derived according to a tolerance criterion given in terms of the step width of the first Shapiro step. The simulation was also compared with an experimental observation for 1 V SINIS array with 8192 junctions.

Zitierung

Kim, K.-T., Behr, R., & Müller, F. (2003). Margins of junction parameter spread for non-hysteretic Josephson junction arrays. Superconductor Science and Technology, 16(12), 1344–1348.

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