| Zugriffsnummer | 11209 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | An X-ray BBB Michelson interferometer |
| Autor(in); Institution |
Sutter, John P.; SPring-8/JASRI, Kouto, JAPAN
Ishikawa, Tetsuya; SPring-8/RIKEN, Kouto, JAPAN
Kuetgens, Ulrich; 4.3, Quantenoptik und Längeneinheit, PTB-Braunschweig
Materlik, Gerhard; Diamond Light Source Ltd, Rutherford Appleton Laboratory, Chilton, UK
Nishino, Yoshinori; SPring-8/RIKEN, Kouto, JAPAN
Rostomyan, Armen; Yerevan State University, Yerevan, REPUBLIC OF ARMENIA
Tamasaku, Kenji; SPring-8/RIKEN, Kouto, JAPAN
Yabashi, Makina; SPring-8/JASRI, Kouto, JAPAN
|
| Quelle/Jahr | Journal of Synchrotron Radiation: 11 (2004), 378 - 385 |
| ISSN | 0909-0495 |
| DOI | |
| Verlag | Oxford: Blackwell |
| Freie Schlagworte | X-ray Michelson Interferometer ; free-electron laser |
| Zusammenfassung | A new X-ray Michelson interferometer based on the BBB interferometer of Bonse and Hart and designed for X-rays of wavelength ≈ 1 Å was described in a previous paper. Here, a further test carried out at the SPring-8 1 km beamline BL29XUL is reported. One of the BBB's mirrors was displaced by a piezo to introduce the required path-length difference. The resulting variation of intensity with piezo voltage as measured by an avalanche photodiode could be ascribed to the phase variation resulting from the path-length change, with a small additional contribution from the change of the position of the lattice planes of the front mirror relative to the rest of the crystal. This "Michelson fringe" interpretation is supported by the observed steady movement across the output beam of the interference fringes produced by a refractive wedge when the piezo voltage was ramped. The front-mirror displacement required for one complete fringe at the given wavelength is only 0.672 Å; therefore, a quiet environment is vital for operating this device, as previous experiments have shown. |
