Causal characteristic impedance of planar transmission lines

Williams, Dylan F.; Alpert, B. K.; Arz, Uwe; Walker, David K.; Grabinski, Hartmut

doi:https://doi.org/10.1109/tadvp.2003.817339

Zugriffsnummer	10258
Dokumenttyp	Zeitschriftenartikel
Sprache	Englisch
Titel	Causal characteristic impedance of planar transmission lines
Autor(in); Institution	Williams, Dylan F.; National Institute of Standards and Technology (NIST), Boulder, CO, USA Alpert, B. K.; National Institute of Standards and Technology (NIST), Boulder, CO, USA Arz, Uwe; 2.2, Hochfrequenz und Felder, PTB-Braunschweig Walker, David K.; National Institute of Standards and Technology (NIST), Boulder, CO, USA Grabinski, Hartmut; Universität Hannover, Laboratorium für Informationstechnologie, Hannover, GERMANY
Quelle/Jahr	IEEE Transactions on Advanced Packaging: 26 (2003), 2, 165 - 171
ISSN	1521-3323
DOI	https://doi.org/10.1109/tadvp.2003.817339
Verlag	New York, NY: IEEE
Freie Schlagworte	causality ; characteristic impedance ; circuit theory ; coplanar waveguide ; microstrip
Zusammenfassung	We compute power-voltage, power-current, and causal definitions of the characteristic impedance of microstrip and coplanar-waveguide transmission lines on insulating and conducting silicon substrates, and compare to measurement.

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Williams, D. F., Alpert, B. K., Arz, U., Walker, D. K., & Grabinski, H. (2003). Causal characteristic impedance of planar transmission lines. IEEE Transactions on Advanced Packaging, 26(2), 165–171. https://doi.org/10.1109/tadvp.2003.817339

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