| Zugriffsnummer | 10132 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | Precise measurement of the lattice parameters of α-Al2O3 in the temperature range 4.5 K - 250 K using the Mössbauer wavelength standard |
| Autor(in); Institution |
Lucht, M.; Universität Hamburg, Institut für Experimentalphysik, Hamburg, GERMANY
Lerche, M.; Universität Hamburg, Institut für Experimentalphysik, Hamburg, GERMANY
Wille, H.-C.; Universität Hamburg, Institut für Experimentalphysik, Hamburg, GERMANY
Shvyd'ko, Yu. V.; Universität Hamburg, Institut für Experimentalphysik, Hamburg, GERMANY
Rüter, H. D.; Universität Hamburg, Institut für Experimentalphysik, Hamburg, GERMANY
Gerdau, A.; Universität Hamburg, Institut für Experimentalphysik, Hamburg, GERMANY
Becker, Peter; 4.3, Quantenoptik und Längeneinheit, PTB-Braunschweig
|
| Quelle/Jahr | Journal of Applied Crystallography: 36 (2003), 4, 1075 - 1081 |
| ISSN | 0021-8898 |
| DOI | |
| URL | |
| Verlag | Oxford: Blackwell |
| Freie Schlagworte | Mössbauer radiation ; lattice parameter of sapphire |
| Zusammenfassung | The lattice parameter of α-Al2O3 have been measured in a temperature range from 4.5 K to 250 K with a relative accuracy of better than 6 x 10-6. The experimental method uses Bragg back-scattering and the recently proposed Mössbauer wavelength standard, i.e. the wavelength λM = 86.025474(16) pm of the nuclear resonance radiation of 57Fe (Shvyd'ko et al., 2000), which have previously been applied successfully to measure the lattice parameters of α-Al2O3 at temperatures between 286 K and 374 (Shvyd'ko et al., 2002).The experimental data in the range from 4.5 K to 374 K are consistent with the Debye model of thermal expansion. At 4.5 K, the thermal expansion coefficient is as low as 1.2(0.9) x 10-10K-1 in a direction. |
Zitierung
Lucht, M., Lerche, M., Wille, H.-C., Shvyd'ko, Y. V., Rüter, H. D., Gerdau, A., & Becker, P. (2003). Precise measurement of the lattice parameters of α-Al₂O₃ in the temperature range 4.5 K - 250 K using the Mössbauer wavelength standard. Journal of Applied Crystallography, 36(4), 1075–1081. https://doi.org/10.1107/s0021889803011051